Semiconductor and Nanotechnology
CT Associates has a long history of using and developing cutting edge nanoparticle and contamination metrology to advance industry knowledge and improve the processing and yield of semiconductor chips.
Operation of components at critical or wear-accelerating conditions per industry specifications, or suited to your specific needs, in a wide variety of common or hazardous chemicals.
Particle retention and initial-rinse testing of membrane, cartridge, or capsule filters for particles as small as 5 nm. Testing can be conducted per industry standards or to suit individual needs.
Evaluation of components and assemblies for particle, particle precursor, organic, ionic, and trace metal contamination during rinse-down or extraction testing in ultrapure water.