Advancing Nanocontamination Measurement and Control
Who We Are
Since our founding in 1991, CT Associates, Inc. has built a reputation for innovative and high-quality research, development, testing and instrument development in support of the semiconductor and medical device industries. From our technology base in contamination measurement and control, particle sizing technology, and filtration, we have expanded into other areas including organic particle precursors, component reliability, permeation measurement and modeling, and medical device testing. We have the expertise and analytical equipment necessary to assist you in new product development and solving your most difficult nanocontamination challenges.
What We Do
One of our core competencies is the measurement of nanoparticles. Our particle measurement expertise helps our customers identify nanoparticle contamination and optimize cleanliness in a variety of high purity process fluids.
On-wafer Particle Counting to 8 nm, with Raman Spectroscopy
CT Associates, in collaboration with UNISERS AG, has completed the installation of the UNISERS’ research and development wafer inspection tool at our Minnesota facility. The tool's new home is our recently updated ISO Class 3 cleanroom. The tool is capable of detecting 8nm particles and larger on a wafer surface. We are in the final stage of qualification and are scheduled to begin full operation by the end of February 2024.
In addition to particle sizing on a wafer, the tool has the capability to chemically fingerprint particles using Raman Spectroscopy. Additional details can be found on the UNISERS website.